Metallic adhesion in atomic-size junctions.

نویسندگان

  • G Rubio-Bollinger
  • P Joyez
  • N Agraït
چکیده

We report high resolution simultaneous measurements of electrical conductance and force gradient between two sharp gold tips as their separation is varied from the tunneling distance to atomic-size contact. The use of atomically sharp tips minimizes van der Waals interaction, making it possible to identify the short-range metallic adhesion contribution to the total force.

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عنوان ژورنال:
  • Physical review letters

دوره 93 11  شماره 

صفحات  -

تاریخ انتشار 2004